CPP-TMR sensor with non-orthogonal free and reference layer magnetization orientation

ABSTRACT

A TMR sensor structure having free and reference layers, where the magnetic orientations of the free and reference layers are non-orthogonal. In one embodiment, a ferromagnetic free layer film has a bias-point magnetization nominally oriented in plane of the film thereof, in a first direction at an angle θfb with respect to a longitudinal axis being defined as the intersection of the plane of deposition of the free layer and the plane of the ABS. A ferromagnetic reference layer film has a bias-point magnetization nominally oriented in a plane of the film thereof, in a second direction at angle θrb with respect to said longitudinal axis that is not orthogonal to the said first direction.

RELATED APPLICATIONS

This application is a continuation in part of U.S. patent application Ser. No. 11/189,170 filed Jul. 25, 2005 now U.S. Pat. No. 7,411,765, and claims priority to U.S. Provisional Patent Application Ser. No. 60/700,549 filed Jul. 18, 2005 and entitled “Thermal and Spin-Torque Noise in CPP (TMR and/or GMR) Read Sensors” to Smith et al.; each of which is herein incorporated by reference.

FIELD OF THE INVENTION

The present invention relates to magnetic heads, and more particularly, this invention relates to a Current-Perpendicular-to-Plane (CPP) Tunneling Magnetoresistance (TMR) heads having nonorthogonal alignment of free and reference layer magnetizations.

BACKGROUND OF THE INVENTION

The heart of a computer is a magnetic disk drive which includes a rotating magnetic disk, a slider that has read and write heads, a suspension arm above the rotating disk and an actuator arm that swings the suspension arm to place the read and write heads over selected circular tracks on the rotating disk. The suspension arm biases the slider into contact with the surface of the disk when the disk is not rotating but, when the disk rotates, air is swirled by the rotating disk adjacent an air bearing surface (ABS) of the slider causing the slider to ride on an air bearing a slight distance from the surface of the rotating disk. When the slider rides on the air bearing the write and read heads are employed for writing magnetic impressions to and reading magnetic signal fields from the rotating disk. The read and write heads are connected to processing circuitry that operates according to a computer program to implement the writing and reading functions.

Magnetoresistive (MR) read sensors, commonly referred to as MR heads, are used in all high capacity disk drives. An MR sensor detects a magnetic field through the change in its resistance of as a function of the strength and direction of the magnetic flux being sensed by the MR layer. The standard type of MR sensor in disk drives manufactured today employs the tunneling magnetoresistive (TMR) effect, such that the resistance varies as a function of the spin-dependent quantum-mechanical tunneling transmission of the conduction electrons between two or more ferromagnetic layers separated by an insulating, non-magnetic tunneling barrier. The resistance of these sensors depends on the relative orientation of the magnetization of the different magnetic layers. For the TMR sensor, the electron flow provides a current perpendicular to-the-plane (CPP) of the magnetic layers. These devices are different in physical mechanism, material, and geometry than the current-in-plane giant magnetoresistive (CIP-GMR) sensor technology which they are presently replacing.

Not unlike their CIP-GMR predecessors, the resistance for TMR sensors depends primarily on the relative magnetization of only two layers of ferromagnetic material (e.g., CoFe), which in the TMR case are separated by a very thin (˜1 nm) insulating tunnel barrier layer (e.g., MgO). In a “simple” TMRsensor, one of the ferromagnetic layers, referred to as the reference layer (or pinned layer), has its magnetization typically pinned by exchange coupling with an antiferromagnetic (e.g., IrMn) layer. The pinning field generated by the antiferromagnetic layer should be sufficiently large to ensure that the magnetization direction of the reference layer remains fixed during the application of external fields (e.g., fields from bits recorded on the disk). The magnetization of the other ferromagnetic layer, referred to as the free layer, however, is not fixed and is free to rotate in response to the field from the recorded magnetic medium (the signal field). U.S. Pat. No. 5,206,590 granted to Dieny et al., incorporated herein by reference, discloses a “simple” CIP-GMR sensor operating on the basis of the GMR effect.

Almost universally employed in present day sensors ((either TMR or CIP-GMR) is the use is the use of antiparallel (AP)-pinning. In such AP-pinned sensors, the reference layer is a laminated structure of two ferromagnetic layers separated by a non-magnetic AP-coupling layer such that the magnetizations of the two ferromagnetic layers are strongly coupled together antiferromagnetically in an antiparallel orientation. The first ferromagnetic layer, referred to as the pinned layer, has its magnetization pinned/fixed in orientation by direct exchange coupling to an AFM layer. The second ferromagnetic layer serves as the reference layer in determining the resistance of the device, is strongly AP-coupled to the pinned layer, and by effect is also fixed in orientation. The cancellation of magnetic moment and demagnetizing fields of the AP-aligned pinned and reference layers greatly improves the stability of the reference layer relative to that obtained for the simple SV sensor of FIG. 1A.

Referring to FIG. 1B, an AP-Pinned TMR sensor 200 comprises a free layer 210 separated from a laminated AP-pinned layer structure 220 by a nonmagnetic, electrically-conducting spacer layer 215. The magnetization of the laminated AP-pinned layer structure 220 is fixed by an AFM layer 230. The laminated AP-pinned layer structure 220 comprises a first ferromagnetic (pinned) layer 226 and a second ferromagnetic (reference) layer 222 separated by an antiparallel coupling layer (APC) 224 of nonmagnetic material. The two ferromagnetic layers 226, 222 (FM₁ and FM₂) in the laminated AP-pinned layer structure 220 have their magnetization directions oriented antiparallel, as indicated by the arrows 227, 223 (arrows pointing out of and into the plane of the paper respectively).

For TMR sensors, the conductance G of the TMR sensor (more so the resistance R=1/G), is believed to be a linear function of cos(θ), where θ is the angle between the (in-plane) magnetization vectors of the reference and free layer structures. Specifically, θ≡θ_(f)−θ_(r), where θ_(f) is the angle of (in-plane) magnetization of the free layer and θ_(r) represents the angle of (in-plane) magnetization of the reference layer. The sensitivity of the sensor can be quantified by its magnetoconductance coefficient ΔG/G_(min), where ΔG=G_(max)−G_(min) is the maximum change in the conductance of the sensor. However, it is much more common, today (and historically) to characterize TMR sensors by the TMR ratio ΔR/R_(min), where ΔR=R_(max)−R_(min) the maximum change in the resistance of the sensor. It is virtually always the case in TMR sensors as practiced in the art that R_(max)=R(θ=180°)=1/G_(min) and R_(min)=R(θ=0)=1/G_(max). The TMR ratio ΔR/R_(min), is mathematically identical in magnitude to, ΔG/G_(min).

In operation, the sensor is subjected to positive and negative magnetic signal fields H_(sig) from a moving magnetic disk. These positive and negative signal fields are typically equal in magnitude, and oriented orthogonal to the plane of the disk (or ABS plane). In addition to maximizing the magnitude of the readback signal from the TMR sensor, it is also desirable that positive and negative readback signals are equal as well.

It is well known magnetically that the rotation of the free layer magnetization angle θ_(f) in response to magnetic signal fields from the disk, is such that sin(θ_(f)) will vary approximately linearly (to first order) with the amplitude of the signal field H_(sig). This is particularly true if θ_(fb)=0 is approximately the (quiescent) bias-point orientation of the free layer in the absence of signal fields, in which case the sensitivity d(sin(θ_(f))/dH_(sig) is also generally maximized. It follows that θ_(fb)≅0° will be a near-optimal bias point configuration with respect to the free layer:

However, consideration of the optimized (pinned) angle θ_(r) for the reference layer in a TMR sensor can be different than that of θ_(r)≅±90° that was historically practiced in the art for CIP-GMR sensors, and which often continues for current art TMR read sensors. In particular, if it is the conductance G that varies linearly with cos(θ), i.e.,

${G = {G_{\min} + {\frac{1}{2}\left( {1 + {\cos\;\theta}} \right)\Delta\; G}}},$ it follows that

$R_{b} = \frac{R_{\max}}{1 + {\left( {\Delta\;{R/R_{\min}}} \right)\frac{1}{2}\left( {1 + {\cos\;\theta_{r}}} \right)}}$ ${\frac{\mathbb{d}R}{\mathbb{d}H_{sig}}} = {\frac{R_{\max}{{\sin\;\theta_{r}}}}{\left\lbrack {1 + {\left( {\Delta\;{R/R_{\min}}} \right)\frac{1}{2}\left( {1 + {\cos\;\theta_{r}}} \right)}} \right\rbrack^{2}}{\frac{{\mathbb{d}\sin}\;\theta_{r}}{\mathbb{d}H_{sig}}}}$ assuming the aforementioned optimum free layer bias-point angle θ_(fb)≅0°

In the case where ΔR/R_(min)<<1, it is readily deduced that the optimum reference layer point is θ_(r)≅±90°, as this both maximizes sensitivity |dR/dH_(sig)| and puts the bias resistance point R_(b)≅½(R_(min)+R_(max)) at the midpoint for maximizing dynamic range and minimizing asymmetry of sensor response to opposite polarities of H_(sig). This circumstance applied to traditional CIP-GMR sensors, as well as older TMR sensors such as those made using Alumina (Al₂O₃) tunneling barriers. However, for state-of-the-art TMR read sensors (e.g., CoFeB magnetic layers with MgO tunnel barriers) where ΔR/R_(min)≈1, it follows from the above equation that both |dR/dH_(sig)| and R_(b) will be better optimized when cos θ_(r)≅cos θ<0 is negative, corresponding to an obtuse bias angle |θ_(b)=θ_(fb)−θ_(r)|>90°. The actual optimum point, by these criteria, depends on how large the TMR ratio ΔR/R_(min) is for a given sensor.

The present invention addresses several different ways to achieve this non-orthogonal bias point

SUMMARY OF THE INVENTION

As mentioned above, for traditional CIP-GMR sensors, or for older TMR sensors sensors, the (in-plane) angular magnetization orientations θ_(r) and θ_(fb) of the reference and free layer structures at the bias point are ideally orthogonal each other, such that |θ_(rb)−θ_(r)|≅90°. However, as indicated in the graph of FIG. 2, TMR sensors can show magnetoresistance that is nonlinear in the quantity Q=cos(θ_(f)−θ_(r)). This nonlinearity is such as to shift the optimum sensitivity point to have free and reference bias magnetizations be more antiparallel, i.e., |θ_(fb)−θ_(r)|>90° such that Q_(b)=cos(θ_(fb)−θ_(r)) is negative rather than zero. The present invention includes and addresses several different ways to achieve this non-orthogonal bias point.

A TMR-SV head according to one embodiment includes a free layer having a nominal bias point magnetization orientation θ_(fb) in a first direction with respect to (and substantially parallel with) a longitudinal axis defined as the intersection of the plane of deposition of the free layer, and the plane of the air-bearing surface (ABS), a reference layer having a magnetization orientation θ_(r) nominally oriented in a second direction that is not orthogonal to θ_(fb), and a tunnel barrier layer between the free and reference layers.

A TMR magnetic head according to another embodiment includes a pinned layer, a nonmagnetic antiparallel (AP)-coupling layer above the pinned layer, and a reference layer-above the AP-coupling layer, the reference layer magnetization being substantially antiparallel to that of the pinned layer. A tunnel barrier layer is positioned above the reference layer, and a free layer is positioned above the tunnel barrier layer. The free layer magnetization θ_(fb) is nominally oriented in a first direction with respect to (and substantially parallel with) a longitudinal axis defined as the intersection of the plane of deposition of the free layer, and the ABS plane. The reference layer has a magnetization orientation θ_(r) normally oriented in a second direction that is not orthogonal to θ_(fb).

A magnetic storage system implementing any of the devices described above includes magnetic media, at least one head for reading from and writing to the magnetic media, each head having a sensor and a write element coupled to the sensor. A slider supports the head. A control unit is coupled to the head for controlling operation of the head.

Other aspects and advantages of the present invention will become apparent from the following detailed description, which, when taken in conjunction with the drawings, illustrate by way of example the principles of the invention.

BRIEF DESCRIPTION OF THE DRAWINGS

For a fuller understanding of the nature and advantages of the present invention, as well as the preferred mode of use, reference should be made to the following detailed description read in conjunction with the accompanying drawings.

FIG. 1A is an air bearing surface view, not to scale, of a prior art spin valve (SV) sensor.

FIG. 1B is an air bearing surface view, not to scale, of a prior art AP-Pinned SV sensor.

FIG. 2 illustrates the change of resistance (R−Rmin) as a function of cos(θ_(f)−θ_(r)) for a CIP and CPP structure.

FIG. 3 is a simplified drawing of a magnetic recording disk drive system.

FIG. 4 is a partial view of the slider and a merged magnetic head.

FIG. 5 is a partial ABS view, not to scale, of the slider taken along plane 5-5 of FIG. 4 to show the read and write elements of the merged magnetic head.

FIG. 6 is an ABS illustration of a sensor structure, not to scale, according to one embodiment of the present invention.

FIG. 7 is an ABS illustration of a CPP TMR sensor, not to scale, according to an embodiment of the present invention.

FIG. 8 illustrates the change of resistance as a function of cos(m_free−m_ref) for a CPP structure.

FIG. 9 is a graphical representation of magnetic orientations of free and reference layers according to one embodiment.

FIG. 10 is a graphical representation of magnetic orientations of free, reference, and hard bias layers according to one embodiment.

FIG. 11 is a graphical representation of magnetic orientations of free, reference, and antiferromagnetic layers according to one embodiment.

FIG. 12 is a graphical representation of magnetic orientations of free, reference, and pinned layers according to one embodiment.

FIG. 13 is an ABS illustration of a CPP GMR self pinned sensor, not to scale, according to an embodiment of the present invention.

BEST MODE FOR CARRYING OUT THE INVENTION

The following description is the best embodiment presently contemplated for carrying out the present invention. This description is made for the purpose of illustrating the general principles of the present invention and is not meant to limit the inventive concepts claimed herein. Further, particular features described herein can be used in combination with other described features in each of the various possible combinations and permutations.

Referring now to FIG. 3, there is shown a disk drive 300 embodying the present invention. As shown in FIG. 3, at least one rotatable magnetic disk 312 is supported on a spindle 314 and rotated by a disk drive motor 318. The magnetic recording on each disk is in the form of an annular pattern of concentric data tracks (not shown) on the disk 312.

At least one slider 313 is positioned near the disk 312, each slider 313 supporting one or more magnetic read/write heads 321. As the disks rotate, slider 313 is moved radially in and out over disk surface 322 so that heads 321 may access different tracks of the disk where desired data are recorded. Each slider 313 is attached to an actuator arm 319 by means of a suspension 315. The suspension 315 provides a slight spring force which biases slider 313 against the disk surface 322. Each actuator arm 319 is attached to an actuator means 327. The actuator means 327 as shown in FIG. 3 may be a voice coil motor (VCM). The VCM comprises a coil movable within a fixed magnetic field, the direction and speed of the coil movements being controlled by the motor current signals supplied by controller 329.

During operation of the disk storage system, the rotation of disk 312 generates an air bearing between slider 313 and disk surface 322 which exerts an upward force or lift on the slider. The air bearing thus counter-balances the slight spring force of suspension 315 and supports slider 313 off and slightly above the disk surface by a small, substantially constant spacing during normal operation.

The various components of the disk storage system are controlled in operation by control signals generated by control unit 329, such as access control signals and internal clock signals. Typically, control unit 329 comprises logic control circuits, storage means and a microprocessor. The control unit 329 generates control signals to control various system operations such as drive motor control signals on line 323 and head position and seek control signals on line 328. The control signals on line 328 provide the desired current profiles to optimally move and position slider 313 to the desired data track on disk 312. Read and write signals are communicated to and from read/write heads 321 by way of recording channel 325.

The above description of a typical magnetic disk storage system, and the accompanying illustration of FIG. 3 are for representation purposes only. It should be apparent that disk storage systems may contain a large number of disks and actuators, and each actuator may support a number of sliders.

FIG. 4 is a side cross-sectional elevation view of a merged magnetic head 400, which includes a write head portion 402 and a read head portion 404. FIG. 5 is an ABS view of FIG. 4. The spin valve sensor 406 is sandwiched between nonmagnetic electrically insulative first and second read gap layers 408 and 410, and the read gap layers are sandwiched between ferromagnetic first and second shield layers 412 and 414. In response to external magnetic fields, the resistance of the spin valve sensor 406 changes. A sense current (I_(s)) conducted through the sensor causes these resistance changes to be manifested as potential changes. These potential changes are then processed as readback signals by the processing circuitry 329 shown in FIG. 3.

The write head portion 402 of the magnetic head 400 includes a coil layer 422 sandwiched between first and second insulation layers 416 and 418. A third insulation layer 420 may be employed for planarizing the head to eliminate ripples in the second insulation layer caused by the coil layer 422. The first, second and third insulation layers are referred to in the art as an “insulation stack”. The coil layer 422 and the first, second and third insulation layers 416, 418 and 420 are sandwiched between first and second pole piece layers 424 and 426. The first and second pole piece layers 424 and 426 are magnetically coupled at a back gap 428 and have first and second pole tips 430 and 432 which are separated by a write gap layer 434 at the ABS. Since the second shield layer 414 and the first pole piece layer 424 are a common layer this head is known as a merged head. In a piggyback head an insulation layer is located between a second shield layer and a first pole piece layer. First and second solder connections (not shown) connect leads (not shown) from the spin valve sensor 406 to leads (not shown) on the slider 313 (FIG. 3), and third and fourth solder connections (not shown) connect leads (not shown) from the coil 422 to leads (not shown) on the suspension.

As mentioned above, for traditional CIP-GMR sensors, the (in-plane) angular magnetization orientations θ_(ref) of the reference and θ_(free) of the free layers/structures are ideally orthogonal each other. However, as indicated in the graph of FIG. 2, TMR SV sensors show magnetoresistance that is nonlinear in the quantity Q≡cos(θ_(f)−θ_(r)): In particular, the resistance R(Q) has the general form:

$\begin{matrix} {R_{b} = \frac{R_{\max}}{1 + {\left( {\Delta\;{R/R_{\min}}} \right)\frac{1}{2}\left( {1 + Q} \right)}}} & (1) \end{matrix}$ The value of TMR ratio ΔR/R_(min) can typically vary between 0.5 and 1 for state-of-the-art TMR read sensors.

This nonlinearity is such as to shift the optimum sensitivity point to have free and reference bias magnetizations be more antiparallel, i.e., |θ_(fb)−θ_(r)|>90° such that Q_(b)=cos(θ_(fb)−θ_(r)) is negative rather than zero. The present invention includes and addresses several different ways to achieve this non-orthogonal bias point.

More than one type of heads can use the structures described herein, and the structures are particularly adapted to TMR sensors. In the following description, the track edges of the layers are defined by the track width (W). The sensor height is in a direction into the face of the paper in an ABS view. The longitudinal axis of each layer is parallel to both the ABS and the plane of deposition. Unless otherwise described, thicknesses of the individual layers are taken perpendicular to the plane of the associated layer and are provided by way of example only and may be larger and/or smaller than those listed. Similarly, the materials listed herein are provided by way of example only, and one skilled in the art will understand that other materials may be used without straying from the spirit and scope of the present invention. Also, the processes used to form the structures are conventional. Further, each layer can include a single layer, laminates of layers, etc.

TMR

FIG. 6 depicts an ABS view of a sensor structure 600 according to one embodiment. As shown, a sensor 602 is positioned between two longitudinal bias structures 604, the bias structures being positioned outside track edges 605 of the sensor. The sensor 602 can be a standard sensor 602 of any type but having a pinned layer structure. Illustrative sensors 602 are shown in FIG. 7 et seq.

With continued reference to FIG. 6, each bias structure 604 includes a layer of hard bias material 606 which provides a longitudinal bias field to the free layer of the sensor 602 for stabilizing the free layer magnetization. Illustrative thicknesses of the hard bias layers 606 are 50-200 Å and exemplary materials from which the hard bias layers 606 may be formed include CoPt, CoPtCr, etc. Each hard bias layer 606 is sandwiched between a pair of electrically insulative layers (IL1), (IL2) 608, 610. Preferred materials from which the insulative layers 608, 610 can be formed include Al₂O₃ or other dielectric material.

In TMR sensors, the shields 614, 616 also serve as current leads.

FIG. 7 depicts an ABS view of a TMR sensor 700 according to one embodiment. Being a CPP device, the sensing current (I_(s)) flows from one shield to the other shield in a direction perpendicular to the plane of the layers forming the sensor 700.

As shown in FIG. 7, a first shield layer (S1) 702 is formed on a substrate (not shown). The first shield layer 702 can be of any suitable material, such as permalloy (NiFe). An illustrative thickness of the first shield layer is in the range of about 0.5 to about 2 μm.

Seed layers 704, 706 are formed on the first shield layer 702. The seed layers aid in creating the proper growth structure of the layers above them. Note that the stack of seed layers can be varied, and layers may be added or omitted based on the desired processing parameters.

An antiferromagnetic layer (AFM) 710, or antiferromagnet, is formed above the seed layers. The antiferromagnetic layer 710 pins the magnetization orientation of any overlying adjacent ferromagnetic layer. In any of the embodiments, the AFM layer 710 may be IrMn. This material allows easy reorienting of the pinning angle, which can be done more than once at multiple stages in the device build process.

Then an antiparallel (AP) pinned layer structure 712 is formed above the seed layers. As shown in FIG. 7, first and second AP pinned magnetic layers, (AP1-S) and (AP2-S/REF) 714, 716, are separated by a thin layer of an antiparallel coupling (APC-S) material 718 (typically Ru) such that the magnetic moments of the AP pinned layers 714, 716 are strongly self-coupled antiparallel to each other. AP-pinned layer 714 is exchange pinned by the AFM layer 710. AP-pinned layer 716 serves as the reference layer. In the embodiment shown in FIG. 7, the preferred magnetic orientation of the pinned layers 714, 716 is for the first pinned layer 714, into the face of the structure depicted (perpendicular to the ABS of the sensor 702), and out of the face for the second pinned layer 716. Note that this orientation is canted in some embodiments. Illustrative materials for the pinned layer 714 is CoFe, while for reference layer, 716 is CoFeB, separated by a Ru layer 718. Illustrative thicknesses of the pinned and reference layers 714, 716 are between about 10 Å and 40 Å. The Ru layer 718 can be about 5-15 Å, but is preferably selected to provide a saturation field of order 10 kOe (or greater). In a preferred embodiment, each of the AP-pinned layers 714, 716 is about 30 Å with an Ru layer 718 therebetween of about 8 Å.

A tunnel barrier layer (BARRIER) 720 is formed above the pinned layer structure 712. Illustrative materials from which the tunnel barrier 720 may be constructed include metal oxides, such as magnesium oxide, aluminum oxide, etc The tunnel barrier layer 720 can be roughly 7-15 Å thick, typically about 10 Å.

A free layer (FL-S) 722 is formed above the first spacer layer 720. Though nominally stabilized in a substantially longitudinal orientation by the hard-bias structure 604, the magnetization of the free layer 722 remains susceptible to modest reorientation from external transverse magnetic fields, such as those exerted by data recorded on disk media. The relative motion of magnetic orientation of the free layer 722 when affected by data bits on disk media creates variations in the electrical resistance of the sensor 702, thereby creating the signal. Exemplary materials for the free layer 722 are CoFe or CoFeB etc. An illustrative thickness of the free layer 722 is about 30-60 Å. Note that some embodiments may deliberately cant the nominal bias-point orientation of the free layer magnetization to moderately deviate from the longitudinal direction.

The free and reference layers can each be formed of a single layer, a laminate of layers, etc.

A cap (CAP) 728 can be formed above the free layer 722. Exemplary materials for the cap 728 are Ta, Ta/Ru stack, etc. An illustrative thickness range of the cap 728 is 20-60 Å.

Insulating layers (IL) 738 are formed adjacent the stack to isolate it from the hard bias layers 740. A second shield layer (S2) 742 is formed above the cap 728.

Methods of Setting θ_(fb) and/or θ_(r)

FIG. 8 illustrates the change of resistance R as a function of Q≡cos(θ_(f)−θ_(r)) for a TMR structure. Again, this nonlinearity is such as to shift the optimum sensitivity point to have free and reference bias magnetizations are more antiparallel, i.e., |θ_(fb)−θ_(r)|>90° such that Q_(b)=cos(θ_(fb)−θ_(r)) is negative rather than zero. Circle 900 illustrates a preferred range of operation achievable by orienting θ_(fb) and θ_(r) non-orthogonally. The present invention addresses several different ways to achieve this non-orthogonal bias point.

Present day TMR read heads use the magnetostatic field from contiguous, longitudinally magnetized, hard-magnet films (hard-bias) 740 (FIG. 7) to longitudinally stabilize the free layer 722 with θ_(fb)−0°, and exchange pinning to a pinned layer 714 of an AP-coupled pin/reference layer pair to align the reference layer 716 typically transverse to the ABS with θ_(r)≅±90°, and hence approximately orthogonal to the free layer orientation. The pinning direction is set by annealing the entire magnetic film structure (at wafer level, row level, or both) at elevated temperatures and in very large magnetic fields so to maintain (saturate) the pinned layer magnetization in the desired pinning direction during the anneal. In this case, the finished sensor has the pinned/reference layers 714, 716 exchange pinned nominally in the transverse direction (θ_(r)≅±90°), and the free layer 722 magnetized longitudinally (θ_(fb)≅0°), parallel to the direction of the field from the hard-bias 704, approximately orthogonal to the reference layer magnetization. To a modest degree, the free layer orientation is also influenced by the remnant demagnetizing fields from the combined pinned/reference AP-coupled films, as well as (but usually to a yet lesser degree) the interlayer coupling between free and reference layer which depends on the thickness (and roughness) of the layers.

One embodiment of the present invention uses similar device processing, but rotates the quiescent free layer bias-point orientation θ_(fb)≠0° by controlling the magnitude and polarity/direction of the combined demagnetizing and interlayer coupling fields. FIG. 9 illustrates the bias-point magnetic orientations in such an embodiment. The demagnetizing fields can be controlled by the moment mismatch Δm≡m_(ref)−m_(pin), preferentially using Δm≧0 such that the net demagnetizing field is naturally antiparallel to the magnetization direction of the reference layer. The interlayer coupling is controlled by the thickness of the e.g., Cu spacer. One drawback of this embodiment is that to achieve more negative Q_(b)=cos(θ_(fb)−θ_(r)), high combined demagnetizing and coupling fields of several hundred Oe will likely be required. This may require sufficiently large Δm≡m_(ref)−m_(pin) as to destabilize the reference layer.

Another embodiment (which could be combined with the previous embodiment) would cause a rotation of the quiescent free layer magnetization orientation to θ_(fb)≠0° by producing a transverse component to the hard-bias field by a concomitant rotation of the hard-bias magnetization orientation. This embodiment is represented in FIG. 10. Canting the direction of the had-bias magnetization is relatively easy to do with magnetically isotropic hard bias films, simply by controlling the orientation of the magnetic field in an otherwise standard hard-bias initialization process. One drawback of this approach is that the conventional hard bias geometry has the hard-bias contiguous only along the longitudinal edges of the sensor, such that the magnetic shields of the read sensor will preferentially quench transverse fields from the hard bias. As a result, the hard-bias field orientation at the free layer is much more longitudinally oriented than that of the hard-bias magnetization itself, and obtaining a large transverse component of the hard bias field necessitates a substantial reduction of the net hard-bias field magnitude. Achieving a substantially rotated free layer bias-point orientation of while still maintaining magnetic stability with sufficiently large magnitude (500-1000 Oe) of net hard-bias field may not be possible using the conventional hard-bias geometry. While this latter problem may be alleviated by leaving in place (rather than milling away) hard-bias film at the top (opposite the ABS) edge of the sensor, this alternative introduces added fabrication complexity to an already difficult process step.

A preferred embodiment of the present invention, represented in FIG. 11, maintains the free layer in a stable longitudinal orientation, and instead rotates the orientation of the exchange pinning direction |θ_(p)|<90° away from purely transverse such that the now non-zero longitudinal component of the pinning direction is parallel to that of the magnetization of the hard-bias/free-layer, i.e., |θ_(fb)−θ_(p)|<90°. Due to very strong AP coupling between the pinned and reference layers, this will in turn yield a longitudinal component of reference layer magnetization that is antiparallel to that of the free layer, i.e., |θ_(fb)−θ_(r)|>90°. For example, a ferromagnetic pinned layer film can be exchange pinned by an antiferromagnet to maintain the pinned layer bias-point magnetization in the film plane at an orientation angle θ_(pb)≠θ_(fb)±90° which is not orthogonal to the free layer orientation θ_(fb), and wherein the reference layer orientation θ_(rb)≅θ_(pb)±180° is antiparallel to that of the pinned layer. The result is a way of adjusting cos(θ_(fb)−θ_(r)) to have any value between the extremes of 0 and −1. Controlling the pinned direction can be achieved by mechanical fixturing to control the orientation angle that either wafer, row, or single head are mounted relative to that of the magnet used in the annealing process described above. The net field orientation angle seen by the pinned/reference layers during the anneal is also influenced by the presence of the magnetic shields of the sensor, but this is a systematic effect which can either be accounted for, or simply overwhelmed by the several Tesla fields from superconducting annealing magnets currently available for this purpose. This preferred embodiment has the added advantage of not compromising of free layer or pinned/reference stability, by allowing |sin θ_(b)|<<|Q_(b)| and preferentially small or zero Δm. Nonetheless, this embodiment allows the flexibility to be combined with the first (as well as second) embodiments to induce a modest θ_(fb)≠0° in order to deliberately adjust the asymmetric curvature to the magnetic response θ_(f)−θ_(fb) vs. H_(sig) of the free layer. This allows cancellation of the monotonic curvature in the of the function R(Q)−R(Q_(b)) natural to TMR (FIG. 2), such that R(Q)−R(Q_(b)) will vary approximately linearly with H_(sig).

Yet another, more subtle potential advantage of this embodiment may arise from a “micromagnetic anisotropy” effect that is predicted to occur in pinned/reference AP pinned layer structures, despite whether the sensor has the preferred, approximately square sensor geometry (TW

SH), and even in the (magnetostatically most stable) moment-matched case of Δm=0. Magnetostatic in origin, this “micromagnetic anisotropy”: shows biaxial character with easy-axes of relatively broad energy minima along the diagonals of the square sensor (θ_(r)=±135°), and hard-axes with sharper energy maxima in the transverse (θ_(r)=±90°) or longitudinal direction. The magnitude of this biaxial anisotropy increases rapidly as the ratio of thickness to exchange length approaches unity, and may reach several hundred Oe in practical cases of pin/reference layer thickness equivalent to ˜3 nm of CoFe. This places an added burden on necessary exchange pinning strength of the AFM/pinned-layer couple to maintain stability of the conventional transverse θ_(p)=+90° pinning orientation. By employing the third embodiment of the present invention and systematically operating with canted pinned/reference layers orientated significantly closer to the diagonal than purely transverse pinning, the net stability of pinned/reference layer stiffness (particularly if SH≦TW) will be enhanced, and pinned/reference layer magnetic fluctuation noise will be reduced.

In a variation on the above, represented in FIG. 12, that part of the AP-pinned layer structure comprising the AFM layer 710 and AP1-S (pinned layer) 714 from the sensor 700 of FIG. 7 is replaced by the single layer of a hard-magnetic film (HM) 1402 (e.g., CoPt, or CoPtCr) in the sensor 1400 of FIG. 13, which similarly functions both magnetically and electrically in the role of the AP1-S “pinned” layer. The advantage of this variation is that both the total physical thickness, of a hard layer 1402 such as CoPt can be significantly thinner than that of the a typical AFM/AP1-S combination due to the thickness of most applicable AFM layers, e.g., PtMn or IrMn, thus, reducing the net stack thickness that is constrained to fit within the read gap G between the read shields. The orientation of the HMPL can be set in a magnetic field analogously to the procedure used for the hard-bias layers. However, since the magnetization orientations of these distinct hard films will need to be non-collinear in general, it would likely be necessary to introduce magnetic anisotropy into to one or both of these hard layers, or the purpose being to avoid re-orienting the hard layer that was set first during the orientation setting of the second hard layer. One method for introducing such anisotropy in a controlled orientation has been described in copending U.S. patent application entitled Magnetic Read Sensor Employing Oblique Etched Underlayers for Inducing Uniaxial Magnetic Anisotropy in a Hard Magnetic Pinning Layer, Ser. No. 11/097,920, filed Mar. 31, 2005 by Carey et al., and which is herein incorporated by reference.

While various embodiments have been described above, it should be understood that they have been presented by way of example only, and not limitation. For example, the structures and methodologies presented herein are generic in their application to all CPP heads. Thus, the breadth and scope of a preferred embodiment should not be limited by any of the above-described exemplary embodiments, but should be defined only in accordance with the following claims and their equivalents. 

What is claimed is:
 1. A CPP spin-valve magnetic head having an air bearing surface (ABS), comprising: a ferromagnetic free layer film having a bias-point magnetization nominally oriented in plane of the film thereof, in a first direction at an angle θ_(fb) with respect to a longitudinal axis being defined as the intersection of the plane of deposition of the free layer and the plane of the ABS; a ferromagnetic reference layer film having a bias-point magnetization nominally oriented in a plane of the film thereof, in a second direction at angle θ_(rb) with respect to said longitudinal axis that is not orthogonal to the said first direction; and a tunnel barrier layer between the free and reference layers.
 2. A head as recited in claim 1, wherein cos(θ_(fb)−θ_(rb)) is less than zero.
 3. A head as recited in claim 1, wherein cos(θ_(fb)−θ_(rb)) is less than about −0.2.
 4. A head as recited in claim 1, wherein cos(θ_(fb)−θ_(rb)) is less than about −0.5.
 5. A head as recited in claim 1, wherein the reference layer magnetization orientation angle θ_(rb) is approximately orthogonal to the said longitudinal axis, wherein the free layer orientation angle θ_(fb) is not nominally parallel to said longitudinal axis.
 6. A head as recited in claim 5, wherein the orientation θ_(fb) of the free layer magnetization is determined by the polarity and direction of demagnetization and interlayer coupling fields from the reference layer.
 7. A head as recited in claim 5, further comprising hard bias layers positioned on opposite sides of the free layer and having a magnetization direction oriented at an angle from the longitudinal axis of the free layer, wherein θ_(fb) is oriented in the first direction by magnetic fields emanating from the hard bias layers.
 8. A head as recited in claim 7, wherein the magnetization direction of the hard bias layers is oriented at an angle of about 5 to about 30 degrees from the said longitudinal axis, wherein the free layer magnetization is oriented in the first direction θ_(fb) by magnetic fields emanating from the hard bias layers.
 9. A head as recited in claim 1, wherein the free layer magnetization orientation θ_(fb) is substantially parallel to the said longitudinal axis, wherein the reference layer orientation angle θ_(rb) is non-orthogonal to the said longitudinal axis.
 10. A head as recited in claim 9, further comprising a ferromagnetic pinned layer film exchange pinned by an antiferromagnet to maintain the pinned layer bias-point magnetization in the film plane at an orientation angle θ_(pb) which is not orthogonal to the free layer orientation θ_(fb) and wherein the reference layer orientation θ_(rb) is antiparallel to the orientation θ_(pb) Of the pinned layer.
 11. A head as recited in claim 10, wherein the antiferromagnet comprises IrMn.
 12. A magnetic storage system, comprising: magnetic media; at least one head for reading from and writing to the magnetic media, each head having; a sensor having the structure recited in claim 1; a write element coupled to the sensor; a slider for supporting the head; and a control unit coupled to the head for controlling operation of the head.
 13. A CPP magnetic head having an air bearing surface (ABS), comprising: a ferromagnetic pinned layer; an antiparallel coupling layer above the pinned layer; a ferromagnetic reference layer above the antiparallel coupling layer, the reference layer being antiparallel coupled to the pinned layer; a tunnel barrier layer above the reference layer; a ferromagnetic free layer above the tunnel barrier layer, a longitudinal axis being defined as the intersection of the plane of deposition of the free layer and the plane of the ABS; wherein the free layer has a bias-point magnetization orientation nominally in the film plane in a first direction at an angle θ_(fb) with respect to said longitudinal axis; and wherein the reference layer has a bias-point magnetization orientation θ_(rb) nominally in the film plane in a second direction at an angle that is not orthogonal to the first direction.
 14. A head as recited in claim 13, wherein cos(θ_(fb)−θ_(rb)) is less than zero.
 15. A head as recited in claim 13, wherein cos(θ_(fb)−θ_(rb)) is less than about −0.2.
 16. A head as recited in claim 13, wherein cos(θ_(fb)−θ_(rb)) is less than about −0.5.
 17. A head as recited in claim 13, wherein θ_(rb) is substantially orthogonal to said longitudinal axis, wherein θ_(fb) is not nominally parallel to the longitudinal axis of the free layer.
 18. A head as recited in claim 17, wherein the orientation θ_(fb) of the free layer magnetization is determined by the polarity and direction of demagnetization and interlayer coupling fields from the reference and pinned layers.
 19. A head as recited in claim 17, further comprising hard bias layers positioned on opposite sides of the free layer and having a magnetization direction oriented at an angle from the longitudinal axis of the free layer, wherein θ_(fb) is oriented in the first direction by magnetic fields emanating from the hard.
 20. A head as recited in claim 19, wherein the magnetization direction of the hard bias layers is oriented at an angle of about 5 to about 30 degrees from the longitudinal axis of the free layer, wherein θ_(fb) is oriented in the first direction by magnetic fields emanating from the hard bias layers.
 21. A head as recited in claim 13, wherein the free layer magnetization orientation θ_(fb) is substantially parallel to the said longitudinal axis, wherein the reference layer orientation angle θ_(rb) is non-orthogonal to the said longitudinal axis.
 22. A head as recited in claim 21, further comprising an antiferromagnet layer which exchange pins the bias-point magnetization of the pinned layer in a nominal direction in the film plane at orientation angle θ_(pb) which is not orthogonal to the free layer orientation θ_(fb), and wherein the reference layer orientation θ_(rb) is antiparallel to the orientation angle θ_(pb) of the pinned layer.
 23. A head as recited in claim 22, wherein the antiferromagnet comprises IrMn.
 24. A head as recited in claim 13, wherein the direction of the pinned layer magnetization is fixed in orientation by means other than that of exchange pinning to an antiferromagnet layer.
 25. A magnetic storage system, comprising: magnetic media; at least one head for reading from and writing to the magnetic media, each head having: a sensor having the structure recited in claim 13; a write element coupled to the sensor; a slider for supporting the head; and a control unit coupled to the head for controlling operation of the head. 